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OPA2846IDRG4 开发手册 - TI（德州仪器）
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TI（德州仪器）
分类:
放大器、缓冲器
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SOIC-8
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OPA2846IDRG4数据手册
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SBOA094
4
Measuring Board Parasitics in High-Speed Analog Design
3 Capacitive and Inductive Measurement Techniques
A very easy way to measure layout capacitance and inductance is to use large signal triangle
waves as a test waveform. The first step in this process is to isolate the parasitic capacitance, as
shown in Figure 4. From this simple circuit, one can define an extraction technique for the
unknown parasitic in the circuit, C
M
.
C
M
R
S
V
GEN
R
SCOPE1
Channel 1
R
SCOPE2
Channel 2
Shields
Coaxial Cable
Figure 4. Capacitance Test Measurement Circuit
Using an HP8116A Function Generator
In this example, an HP8116A function generator (Vgen) is connected as shown in Figure 4. The
center conductor of two coaxial cables is soldered to the PCB trace and sense line into Channel
Two to ground (or other planes/traces of interest). The shields are tied together as shown in
Figure 4. The two measurement cables are connected to Channel One and Two of the
oscilloscope, set to show an input 50Ω termination (R
scope1
, R
scope2
).
R
50
Ω
R
SCOPE1
50
Ω
R
SCOPE2
50
Ω
C
M
V
S
V
1
V
2
Scope
Source
i =C
dV
dT
T
+V
P
0V
−V
P
F=
1
T
Figure 5. Computing V
2
for Triangle Wave V
1
Looking at the analysis circuit of Figure 5, and recognizing that V
1
is a triangle wave, we can
easily compute the current through the unknown capacitance as simply:
i + C
dV
dt
(1)
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