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AD8497CRMZ_PROMO
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AD8497CRMZ_PROMO数据手册
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AD8494/AD8495/AD8496/AD8497
Rev. C | Page 4 of 16
A Grade C Grade
Parameter Test Conditions/Comments Min Typ Max Min Typ Max Unit
TEMPERATURE RANGE (T
A
)
Specified Performance
AD8494/AD8495 0 50 0 50 °C
AD8496/AD8497 25 100 25 100 °C
Operational −40 +125 −40 +125 °C
1
Ambient temperature rejection specifies the change in the output measurement (in °C) for a given change in temperature of the cold junction. For the AD8494 and
AD8495, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 0°C and 50°C ambient temperature. For the AD8496 and
AD8497, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 25°C and 100°C ambient temperature.
2
Error does not include thermocouple gain error or thermocouple nonlinearity.
3
With a 100 kΩ load, measurement junction temperatures beyond approximately 880°C for the AD8494 and AD8496 and beyond approximately 960°C for the AD8495
and AD8497 require supply voltages larger than 5 V or a negative voltage applied to the reference pin. Measurement junction temperatures below 5°C require either a
positive offset voltage applied to the reference pin or a negative supply.
4
Input stage uses PNP transistors, so bias current always flows out of the part.
5
Large output currents can increase the internal temperature rise of the part and contribute to cold junction compensation (CJC) error.
6
Unbalanced supplies can also be used. Care should be taken that the common-mode voltage of the thermocouple stays within the input voltage range of the part.

AD8497CRMZ_PROMO 数据手册

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