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ADS8320E/250G4
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ADS8320E/250G4数据手册
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Vin(V)
ERROR
-15 -12 -9 -6 -3 0 3 6 9 12 15
-0.0025
-0.002
-0.0015
-0.001
-0.0005
0
0.0005
0.001
0.0015
0.002
0.0025
0.003
18
ADS8320
SBAS108E MAY 2000REVISED DECEMBER 2016
www.ti.com
Product Folder Links: ADS8320
Submit Documentation Feedback Copyright © 2000–2016, Texas Instruments Incorporated
Typical Applications (continued)
8.2.1.3 Application Curves
8.2.1.3.1 Static Test (DC)
Figure 23 shows the error, which is the measured output voltage minus the ideal output voltage.
Figure 23. Error (Measured V
OUT
Minus Ideal V
OUT
) vs Input Voltage
8.2.1.3.2 Dynamic Test (AC)
For the dynamic test, sine wave is applied at the input of the board with fixed amplitude equal to –1 dBFS and a
varying frequency of 0.5 kHz, 1 kHz, 5 kHz, and 10 kHz. Figure 24 shows the test result for 0.5 kHz.
Figure 24. FFT at 500 Hz (Input Signal –1 dBFS)
For step-by-step design procedure, circuit schematics, bill of materials, printed circuit board (PCB) files,
simulation results, and test results, refer to TI Precision Design TIDA-00564, Universal Sensor IF SAR Booster
Pack Reference Design.

ADS8320E/250G4 数据手册

TI(德州仪器)
31 页 / 0.65 MByte
TI(德州仪器)
5 页 / 0.26 MByte

ADS8320E250 数据手册

TI(德州仪器)
TEXAS INSTRUMENTS  ADS8320E/250  模数转换器, 16 bit, 100 kSPS, 单, 2.7 V, 5.25 V, VSSOP
TI(德州仪器)
16位高速2.7V到5V微功耗采样模拟数字转换器 16-Bit, High-Speed, 2.7V to 5V microPower Sampling ANALOG-TO-DIGITAL CONVERTER
TI(德州仪器)
16 位高速 2.7V 至 5V 微功耗采样模数转换器 (ADC) 8-VSSOP -40 to 85
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