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B57881S0123F000
7.465
导航目录
  • 封装尺寸在P2
  • 焊盘布局在P19
  • 型号编码规则在P2
  • 封装信息在P8P10P12
  • 焊接温度在P17P18
  • 应用领域在P2
  • 电气规格在P2
B57881S0123F000数据手册
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Reliability data
Test Standard Test conditions R
25
/R
25
(typical)
Remarks
Storage in
dry heat
IEC
60068-2-2
Storage at upper
category temperature
T: 155 °C
t: 1000 h
< 2% No visible
damage
Storage in damp
heat, steady state
IEC
60068-2-78
Temperature of air: 40 °C
Relative humidity of air: 93%
Duration: 56 days
< 1% No visible
damage
Rapid temperature
cycling
IEC
60068-2-14
Lower test temperature: 55 °C
Upper test temperature: 155 °C
Number of cycles: 100
< 2% No visible
damage
Endurance P
max
: 100 mW
t: 1000 h
< 3% No visible
damage
Long-term stability
(empirical value)
Temperature: 70 °C
t: 10000 h
< 3% No visible
damage
Temperature measurement B57881S
Leaded NTC thermistors, lead spacing 2.5 mm S881
Page 3 of 27Please read Cautions and warnings and
Important notes at the end of this document.

B57881S0123F000 数据手册

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B57881S0123 数据手册

Epcos(爱普科斯)
NTC热敏电阻温度测量 NTC thermistors for temperature measurement
Epcos(爱普科斯)
NTC热敏电阻温度测量 NTC thermistors for temperature measurement
Epcos(爱普科斯)
NTC热敏电阻温度测量 NTC thermistors for temperature measurement
TDK-EPC(爱普科斯)
TDK(东电化)
TDK-EPC(爱普科斯)
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