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器件3D模型￥ 24.609
L6470H 数据手册 - ST Microelectronics（意法半导体）
制造商:
ST Microelectronics（意法半导体）
分类:
电机驱动器
封装:
HTSSOP-28
描述:
STMICROELECTRONICS L6470H 芯片, 电机驱动器, MICROSTPNG, 7A, 28HTSSOP
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P16P17P18Hot
典型应用电路图在P19P20
原理图在P8
封装尺寸在P67P68P69P70P71
封装信息在P1
功能描述在P21P22P23P24P25P26P27P28P29P30P31P32
技术参数、封装参数在P9P73
应用领域在P1P73
电气规格在P11P12P13P14P15P38
导航目录
L6470H数据手册
Page:
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DocID16737 Rev 6 13/73
L6470 Electrical characteristics
73
V
OL
Low logic level output voltage
(6)
V
DD
= 3.3 V, I
OL
= 4 mA 0.3
V
V
DD
= 5 V, I
OL
= 4 mA 0.3
V
OH
High logic level output voltage
V
DD
= 3.3 V, I
OH
= 4 mA 2.4
V
V
DD
= 5 V, I
OH
= 4 mA 4.7
R
PU
R
PD
CS pull-up and STBY pull-down resistors
CS = GND;
STBY/RST = 5 V
335 430 565 k
I
logic
Internal logic supply current
3.3 V V
REG
externally supplied,
internal oscillator
3.7 4.3 mA
I
logic,STBY
Standby mode internal logic supply
current
3.3 V V
REG
externally supplied 2 2.5 µA
f
STCK
Step-clock input frequency 2 MHz
Internal oscillator and external oscillator driver
f
osc,i
Internal oscillator frequency
T
j
= 25 °C,
V
REG
= 3.3 V
-3% 16 +3% MHz
f
osc,e
Programmable external oscillator
frequency
832MHz
V
OSCOUTH
OSCOUT clock source high level voltage
Internal oscillator 3.3 V V
REG
externally supplied;
I
OSCOUT
= 4 mA
2.4 V
V
OSCOUTL
OSCOUT clock source low level voltage
Internal oscillator 3.3 V V
REG
externally supplied;
I
OSCOUT
= 4 mA
0.3 V
t
rOSCOUT
t
fOSCOUT
OSCOUT clock source rise and fall time Internal oscillator 20 ns
t
extosc
Internal to external oscillator switching
delay
3ms
t
intosc
External to internal oscillator switching
delay
1.5 µs
SPI
f
CK,MAX
Maximum SPI clock frequency
(7)
5MHz
t
rCK
t
fCK
SPI clock rise and fall time
(7)
C
L
= 30 pF 25 ns
t
hCK
t
lCK
SPI clock high and low time
(7)
75 ns
t
setCS
Chip select setup time
(7)
350 ns
t
holCS
Chip select hold time
(7)
10 ns
t
disCS
Deselect time
(7)
800 ns
t
setSDI
Data input setup time
(7)
25 ns
t
holSDI
Data input hold time
(7)
20 ns
Table 5. Electrical characteristics (continued)
Symbol Parameter Test condition Min. Typ. Max. Unit
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