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M27C256B-45XF1 数据手册 - ST Microelectronics（意法半导体）
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M27C256B-45XF1数据手册
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M27C256B
4/16
DEVICE OPERATION
The operating modes of the M27C256B are listed
in the Operating Modes. A single power supply is
required in the read mode. All inputs are TTL lev-
els except for V
PP
and 12V on A9 for Electronic
Signature.
Read Mode
The M27C256B has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E
) is the power
control and should be used for device selection.
Output Enable (G
) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
dresses are stable, the address access time
(t
AVQV
) is equal to the delay from E to output
(t
ELQV
). Data is available at the output after delay
of t
GLQV
from the falling edge of G, assuming that
E
has been low and the addresses have been sta-
ble for at least t
AVQV
-t
GLQV
.
Standby Mode
The M27C256B has a standby mode which reduc-
es the supply current from 30mA to 100µA. The
M27C256B is placed in the standby mode by ap-
plying a CMOS high signal to the E
input. When in
the standby mode, the outputs are in a high imped-
ance state, independent of the G
input.
Table 5. AC Measurement Conditions
High Speed Standard
Input Rise and Fall Times ≤ 10ns ≤ 20ns
Input Pulse Voltages 0 to 3V 0.4V to 2.4V
Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V
Figure 3. AC Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
C
L
C
L
= 30pF for High Speed
C
L
= 100pF for Standard
C
L
includes JIG capacitance
3.3kΩ
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance
(1)
(T
A
= 25 °C, f = 1 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol Parameter Test Condition Min Max Unit
C
IN
Input Capacitance
V
IN
= 0V
6pF
C
OUT
Output Capacitance
V
OUT
= 0V
12 pF
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