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器件3D模型￥ 4.46
MC9S08SE8CWL 数据手册 - NXP（恩智浦）
制造商:
NXP（恩智浦）
分类:
8位微控制器
封装:
SOIC-28
描述:
NXP MC9S08SE8CWL 微控制器, 8位, S08SE, 20 MHz, 8 KB, 512 Byte, 28 引脚, SOIC
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P4P5Hot
原理图在P3
封装尺寸在P28
型号编码规则在P27P28P29P30P31P32P33P34
技术参数、封装参数在P1P6P7P20P27
电气规格在P6P7P8P9P10P11P12P13P14P15P16P17
导航目录
MC9S08SE8CWL数据手册
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MC9S08SE8 Series MCU Data Sheet, Rev. 4
Electrical Characteristics
Freescale Semiconductor6
3 Electrical Characteristics
This chapter contains electrical and timing specifications.
3.1 Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
3.2 Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in Table 3 may affect device reliability or cause permanent
damage to the device. For functional operating conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (for instance, either V
SS
or V
DD
) or the programmable
pull-up resistor associated with the pin is enabled.
Table 2. Parameter Classifications
P Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D Those parameters are derived mainly from simulations.
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