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Using Data Sheet Impedances
for RF LDMOS Devices
By: Darin Wagner
INTRODUCTION
This document explains the format used by Freescale for
presenting LDMOS impedance information for both
single -ended and push -pull devices on RF Power data
sheets. The purpose of this document is to clarify the use of
this information in the initial design of input and output
matching networks for these devices.
Multiple methods are available for impedance extraction.
The scope of this document does not cover detailed extraction
methods; however, a possible extraction method is explained
here. Whichever method is used, the main concern to be
addressed is the need to de-embed the extracted data back
to the reference plane of the device as shown in Figure 1.
As a byproduct of the impedance extraction methodology,
a zero length width step simulation block should be used
during simulation The MSTEP block for Agilent Advanced
Design System (ADS) users shows the difference between
the reference plane width and the copper lead pad width.
Figure 2 illustrates that the copper lead pad width (Dimension
“b”) is larger than the reference plane width (Dimension “a”).
For more information on this topic, the reference provided
at the end of this document is a rigorous but accurate method
for impedance measurements:
ÎÎÎÎ
DUT
Reference Planes
DUT
Reference Planes
b
a
MRF
XXXXX
DUT Reference Plane
Figure 1. Location of Reference Planes on a Package
Figure 2. Illustration of the Instantaneous
Impedance Change and Need for MSTEP Blocks
b
EB212
Rev. 0, 1/2004
Freescale Semiconductor
Engineering Bulletin
Freescale Semiconductor, Inc., 2004, 2006. All rights reserved.

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晶体管, 射频FET, 40 V, 4 A, 62.5 W, 450 MHz, 520 MHz, PLD-1.5
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射频金属氧化物半导体场效应(RF MOSFET)晶体管 RF LDMOS FET PLD1.5N
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