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SN74LVC257ADR 数据手册 - TI(德州仪器)
制造商:
TI(德州仪器)
分类:
多工器
封装:
SOIC-16
描述:
四路2号线到1线数据选择器/多路复用器3态输出 QUADRUPLE 2 LINE TO 1 LINE DATA SELECTORS/ MULTIPLEXERS WITH 3 STATE OUTPUTS
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P4Hot
典型应用电路图在P1P11P12
原理图在P10
封装尺寸在P15P16P18P19
标记信息在P15P16P17
封装信息在P14P15P16P17P18P19
技术参数、封装参数在P5
应用领域在P1P17P32
电气规格在P7
导航目录
SN74LVC257ADR数据手册
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SN54LVC257A
,
SN74LVC257A
www.ti.com
SCAS294O –JANUARY 1993–REVISED JUNE 2015
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN MAX UNIT
V
CC
Supply voltage –0.5 6.5 V
V
I
Input voltage
(2)
–0.5 6.5 V
V
O
Output voltage
(2) (3)
–0.5 V
CC
+ 0.5 V
I
IK
Input clamp current V
I
< 0 –50 mA
I
OK
Output clamp current V
O
< 0 –50 mA
I
O
Continuous output current ±50 mA
Continuous current through V
CC
or GND ±100 mA
T
stg
Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of V
CC
is provided in the recommended operating conditions table.
7.2 ESD Ratings
VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
(1)
±2000
Electrostatic
V
(ESD)
V
Charged-device model (CDM), per JEDEC specification JESD22-C101, all
discharge
±1000
pins
(2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 1993–2015, Texas Instruments Incorporated Submit Documentation Feedback 5
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