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SN74LVC257ADR
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SN54LVC257A
,
SN74LVC257A
www.ti.com
SCAS294O JANUARY 1993REVISED JUNE 2015
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN MAX UNIT
V
CC
Supply voltage –0.5 6.5 V
V
I
Input voltage
(2)
–0.5 6.5 V
V
O
Output voltage
(2) (3)
–0.5 V
CC
+ 0.5 V
I
IK
Input clamp current V
I
< 0 –50 mA
I
OK
Output clamp current V
O
< 0 –50 mA
I
O
Continuous output current ±50 mA
Continuous current through V
CC
or GND ±100 mA
T
stg
Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of V
CC
is provided in the recommended operating conditions table.
7.2 ESD Ratings
VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
(1)
±2000
Electrostatic
V
(ESD)
V
Charged-device model (CDM), per JEDEC specification JESD22-C101, all
discharge
±1000
pins
(2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 1993–2015, Texas Instruments Incorporated Submit Documentation Feedback 5
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