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STM32F479IIT6 数据手册 - ST Microelectronics（意法半导体）
制造商:
ST Microelectronics（意法半导体）
分类:
微控制器
封装:
LQFP-176
描述:
ARM微控制器 - MCU 16/32-BITS MICROS
Pictures:
3D模型
符号图
焊盘图
引脚图
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页面导航:
引脚图在P47P48P49P50P51P52P53P54P55P56P57P58Hot
典型应用电路图在P116P117P159
封装尺寸在P191P192P193P194P195P196P197P198P199P200P201P202
型号编码规则在P214
标记信息在P193P196P200P204P210P212
技术参数、封装参数在P90P131
电气规格在P88P89P90P91P92P93P94P95P96P97P98P99
型号编号列表在P1
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STM32F479IIT6数据手册
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DocID028010 Rev 3 159/217
STM32F479xx Electrical characteristics
190
Figure 54. ADC accuracy characteristics
1. See also Table 78.
2. Example of an actual transfer curve.
3. Ideal transfer curve.
4. End point correlation line.
5. E
T
= Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves.
EO = Offset Error: deviation between the first actual transition and the first ideal one.
EG = Gain Error: deviation between the last ideal transition and the last actual one.
ED = Differential Linearity Error: maximum deviation between actual steps and the ideal one.
EL = Integral Linearity Error: maximum deviation between any actual transition and the end point
correlation line.
Figure 55. Typical connection diagram using the ADC
1. Refer to Table 76 for the values of R
AIN
, R
ADC
and C
ADC
.
2. C
parasitic
represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 5 pF). A high C
parasitic
value downgrades conversion accuracy. To remedy this,
f
ADC
should be reduced.
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