Datasheet 搜索 > 微控制器 > ST Microelectronics（意法半导体） > STM32F479IIT6 数据手册 > STM32F479IIT6 数据手册 193/217 页
器件3D模型￥ 106.162
STM32F479IIT6 数据手册 - ST Microelectronics（意法半导体）
制造商:
ST Microelectronics（意法半导体）
分类:
微控制器
封装:
LQFP-176
描述:
ARM微控制器 - MCU 16/32-BITS MICROS
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P47P48P49P50P51P52P53P54P55P56P57P58Hot
典型应用电路图在P116P117P159
封装尺寸在P191P192P193P194P195P196P197P198P199P200P201P202
型号编码规则在P214
标记信息在P193P196P200P204P210P212
技术参数、封装参数在P90P131
电气规格在P88P89P90P91P92P93P94P95P96P97P98P99
型号编号列表在P1
导航目录
STM32F479IIT6数据手册
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STM32F479xx Package information
215
Figure 81. LQFP100 - 100-pin, 14 x 14 mm low-profile quad flat
recommended footprint
1. Dimensions are expressed in millimeters.
Device Marking for LQFP100
The following figure gives an example of topside marking orientation versus pin 1 identifier
location.
Figure 82. LQFP100 marking example (package top view)
1. Samples marked "ES" are to be considered as “Engineering Samples”: i.e. they are intended to be sent to
customer for electrical compatibility evaluation and may be used to start customer qualification where
specifically authorized by ST in writing. In no event ST will be liable for any customer usage in production.
Only if ST has authorized in writing the customer qualification Engineering Samples can be used for
reliability qualification trials.
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