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TLV2217-25KC 数据手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
稳压芯片
封装:
TO-220-3
描述:
低压差固定电压REGULATOES LOW-DROPOUT FIXED-VOLTAGE REGULATOES
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TLV2217-25KC数据手册
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若手册格式错乱，请下载阅览PDF原文件
SLVS067L − MARCH 1992 − REVISED APRIL 2005
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics at V
I
= 3.3 V, I
O
= 500 mA, T
J
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
†
TLV2217-18
UNIT
PARAMETER
TEST CONDITIONS
†
MIN TYP MAX
UNIT
Output voltage
I
O
= 20 mA to 500 mA,
V
I
= 3.0 V to 5.5 V
T
J
= 25°C 1.782 1.8 1.818
V
Output voltage I
O
= 20 mA to 500 mA, V
I
= 3.0 V to 5.5 V
T
J
= 0°C to 125°C
1.764 1.836
V
Input voltage regulation V
I
= 3.0 V to 5.5 V 3 9 mV
Ripple rejection f = 120 Hz, V
ripple
= 1 V
PP
, V
I
= 4.5 V −62 dB
Output voltage regulation I
O
= 20 mA to 500 mA 3 17 mV
Output noise voltage f = 10 Hz to 100 kHz 500 µV
Dropout voltage
I
O
= 250 mA
‡
mV
Dropout voltage
I
O
= 500 mA
‡
mV
Bias current
I
O
= 0 2 5
mA
Bias current
I
O
= 500 mA 19 49
mA
†
Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal effects
must be taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 22-µF tantalum capacitor,
with equivalent series resistance of 1.5 Ω, on the output.
‡
Dropout voltage is limited by the input voltage range, with minimum V
I
= 3.0 V.
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