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器件3D模型￥ 0.022
06033C223KAT2A 产品手册 - AVX（艾维克斯）
制造商:
AVX（艾维克斯）
分类:
陶瓷电容
封装:
0603
描述:
AVX 06033C223KAT2A 多层陶瓷电容器, 表面贴装, 0.022 µF, ± 10%, X7R, 25 V, 0603 [1608 公制]
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06033C223KAT2A数据手册
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20
X7R Dielectric
Specications and Test Methods
042718
20
Parameter/Test X7R Specication Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specied tolerance
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 05Vrm @ 120Hz
Dissipation Factor
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Insulation Resistance
100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects Deection: 2mm
Test Time: 30 seconds
Capacitance
Variation
≤ ±12%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.3
Solderability
≥ 95% of each terminal should be covered
with fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for 60seconds.
Store at room temperature for 24 ± 2hours before
measuring electrical properties.
Capacitance
Variation
≤ ±7.5%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
Meets Initial Values (As Above)
Dielectric
Strength
Meets Initial Values (As Above)
Thermal
Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Factor
Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Load Life
Appearance No visual defects
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC for 1000 hours
(+48, -0)
If RV > 10V then Life Test voltage will be 2xRV
but there are exceptions (please contact AVX for
further details on exceptions)
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for
24 ± 2 hours before measuring.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
100917
5
C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test NP0 Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Q
<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF
≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V
Insulation Resistance
100,000MΩ or 1000MΩ - µF, Charge device with rated voltage for
whichever is less 60 ± 5 secs @ room temp/humidity
Charge device with 250% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation
±5% or ±.5 pF, whichever is greater
Flexure
Q Meets Initial Values (As Above)
Stresses
Insulation
≥ Initial Value x 0.3
Resistance
Solderability
≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater
Dip device in eutectic solder at 260ºC for 60
Q Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes
Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Thermal
Shock
Insulation
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength 24 hours at room temperature
Appearance No visual defects
Capacitance
Variation
≤ ±3.0% or ± .3 pF, whichever is greater
Charge device with twice rated voltage in
≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC
Load Life
Q
≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).
(C=Nominal Cap)
<10 pF: Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from test chamber and stabilize at
Resistance room temperature for 24 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
Appearance No visual defects
Capacitance
Variation
≤ ±5.0% or ± .5 pF, whichever is greater
Store in a test chamber set at 85ºC ± 2ºC/
≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours
Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.
Humidity <10 pF: Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from chamber and stabilize at
Resistance room temperature for 24 ± 2 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
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