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AD9223ARSZ 其他数据使用手册 - ADI（亚德诺）
制造商:
ADI（亚德诺）
分类:
AD转换器
封装:
SSOP-28
描述:
ANALOG DEVICES AD9223ARSZ 模数转换器, 12 bit, 3 MSPS, 单, 5 V, SSOP
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典型应用电路图在P8
应用领域在P28
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AD9223ARSZ数据手册
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AN-835
APPLICATION NOTE
One Technology Way • P. O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Te l: 781.329.4700 • Fax: 781.461.3113 • www.analog.com
Understanding High Speed ADC Testing and Evaluation
by Alex Arrants, Brad Brannon and Rob Reeder
Rev. B | Page 1 of 28
SCOPE
This document describes both the characterization and production
test methods used by the High Speed Converter Group of Analog
Devices, Inc., to evaluate high speed analog-to-digital converters
(ADCs). While this application note should be considered a
reference, it is not a substitute for a product data sheet.
DYNAMIC TEST HARDWARE SETUP
SNR, SINAD, worst spur, and IMD are tested using a hardware
setup similar to that shown in Figure 1. In production tests, the
test hardware is highly integrated, but the hardware principles
are the same. The basic setup for dynamic testing includes a
signal generator, band-pass filter, test fixture, low noise power
supplies, encode source (often integrated on the evaluation
board), data acquisition module, and data analysis software.
Analog Devices provides application hardware and software
to aid in bench evaluation.
05941-001
ANALOG INPUT
4LO INPUT
SIGNAL
SYNTHESIZER
SIGNAL
SYNTHESIZER
SIGNAL
SYNTHESIZER
AGILENT
POWER SUPPLY
GAIN CONTROL
INPUT
SPECTRUM
ANALYZER
OPTIONAL
CLOCK
INPUT
CW I/Q
OUTPUTS
SWITCHING
POWER
SUPPLY
SWITCHING
POWER
SUPPLY
6V DC
2A MAX
6V DC
2A MAX
WALL OUTLE
T
100
V
TO 240V AC
47Hz TO 63Hz
PC
RUNNING ADC
ANALYZER
OR VISUAL ANALOG
USER SOFTWARE
OSCILLOSCOPE
OR
Figure 1. Typical Characterization Test Setup
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