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BAT54T1G 产品修订记录 - ON Semiconductor（安森美）
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ON Semiconductor（安森美）
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肖特基二极管
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SOD-123
描述:
ON SEMICONDUCTOR BAT54T1G 小信号肖特基二极管, 单, 30 V, 200 mA, 350 mV, 600 mA, 150 °C
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BAT54T1G数据手册
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若手册格式错乱，请下载阅览PDF原文件
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20425
Issue Date: 29-Aug-2014 Rev. 06-Jan-2010 Page 2 of 6
RELIABILITY DATA SUMMARY:
Qual Vehicles: Cu Wire
MMSZ5270BT1G
Test: Conditions: Interval: Results
Autoclave Ta=121C, RH=100%, ~15psig 96 hrs 0/240
HTRB Ta=150C,80% Rated Voltage 1008 hrs 0/240
H3TRB+PC Ta=85 C RH=85% 1008 hrs 0/240
bias=80% rated V or100V Max
HTSL Ta=150C 1512 hrs 0/240
IOL Ta=25C, delta TJ = 100C
Ton=Toff = 2min 15000 cyc 0/240
TempCycle Ta= -65/150C 2000 cyc 0/240
RSH Ta=260C, 10 sec, elec test 0/90
Solderabiltiy Ta = 245C, 10 sec 0/45
DPA per AEC Q101 post TC 1K cyc 0/6
DPA per AEC Q101 post H3TRB 1008 hrs 0/6
MBR0540T1G
Test: Conditions: Interval: Results
Autoclave Ta=121C, RH=100%, ~15psig 96 hrs 0/160
HTRB Ta=90C,80% Rated Voltage 1008 hrs 0/160
H3TRB+PC Ta=85 C RH=85% 1008 hrs 0/160
bias=80% rated V or100V Max
HTSL Ta=150C 1512 hrs 0/160
IOL Ta=25C, delta TJ = 100C
Ton=Toff = 2min 15000 cyc 0/160
TempCycle Ta= -65/150C 2000 cyc 0/160
RSH Ta=260C, 10 sec, elec test 0/60
Solderabiltiy Ta = 245C, 10 sec 0/30
DPA per AEC Q101 post TC 1K cyc 0/4
DPA per AEC Q101 post H3TRB 1008 hrs 0/4
MBR130T1G
Test: Conditions: Interval: Results
Autoclave Ta=121C, RH=100%, ~15psig 96 hrs 0/84
HTRB Ta=90C,80% Rated Voltage 1008 hrs 0/84
H3TRB+PC Ta=85 C RH=85% 1008 hrs 0/84
bias=80% rated V or100V Max
HTSL Ta=150C 1512 hrs 0/84
IOL Ta=25C, delta TJ = 100C
Ton=Toff = 2min 15000 cyc 0/84
TempCycle Ta= -65/150C 2000 cyc 0/84
RSH Ta=260C, 10 sec, elec test 0/30
Solderabiltiy Ta = 245C, 10 sec 0/15
DPA per AEC Q101 post TC 1K cyc 0/2
DPA per AEC Q101 post H3TRB 1008 hrs 0/2
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