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501JCA20M0000CAF 数据手册 - Silicon Labs（芯科）

制造商:

Silicon Labs（芯科）

分类:

振荡器

封装:

SMD-4

描述:

SILICON LABS 501JCA20M0000CAF 振荡器, MEMS, CMEMS®, Si50x系列, 20 MHz, 20 ppm, 3.3 V, SMD, 3.2mm x 2.5mm, CMOS

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501JCA20M0000CAF数据手册

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X7R Dielectric

Specifications and Test Methods

Parameter/Test X7R Specification Limits Measuring Conditions

Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber

Capacitance Within specified tolerance

≤ 2.5% for ≥ 50V DC rating Freq.: 1.0 kHz ± 10%

Dissipation Factor

≤ 3.0% for 25V DC rating Voltage: 1.0Vrms ± .2V

≤ 3.5% for 25V and 16V DC rating

≤ 5.0% for ≤ 10V DC rating

Insulation Resistance

100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for

whichever is less 120 ± 5 secs @ room temp/humidity

Charge device with 300% of rated voltage for

Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Note: Charge device with 150% of rated

voltage for 500V devices.

Appearance No defects Deflection: 2mm

Capacitance Test Time: 30 seconds

Resistance to Variation

≤ ±12%

Flexure Dissipation

Meets Initial Values (As Above)

Stresses Factor

Insulation

≥ Initial Value x 0.3

Resistance

Solderability

≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC

with fresh solder for 5.0 ± 0.5 seconds

Appearance No defects, <25% leaching of either end terminal

Capacitance

Variation

≤ ±7.5%

Dip device in eutectic solder at 260ºC for 60

Dissipation

Meets Initial Values (As Above)

seconds. Store at room temperature for 24 ± 2

Resistance to

Factor

hours before measuring electrical properties.

Solder Heat

Insulation

Meets Initial Values (As Above)

Resistance

Dielectric

Meets Initial Values (As Above)

Strength

Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes

Capacitance

Variation

≤ ±7.5% Step 2: Room Temp ≤ 3 minutes

Dissipation

Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes

Thermal

Factor

Shock

Insulation

Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes

Resistance

Dielectric

Meets Initial Values (As Above)

Repeat for 5 cycles and measure after

Strength 24 ± 2 hours at room temperature

Appearance No visual defects

Capacitance

Variation

≤ ±12.5%

Dissipation

≤ Initial Value x 2.0 (See Above)

Load Life Factor

Insulation

≥ Initial Value x 0.3 (See Above)

Resistance

Dielectric

Meets Initial Values (As Above)

Strength

Appearance No visual defects

Capacitance

Variation

≤ ±12.5%

Load Dissipation

≤ Initial Value x 2.0 (See Above)

Humidity Factor

Insulation

≥ Initial Value x 0.3 (See Above)

Resistance

Dielectric

Meets Initial Values (As Above)

Strength

Charge device with 1.5 rated voltage (≤ 10V) in

test chamber set at 125ºC ± 2ºC

for 1000 hours (+48, -0)

Remove from test chamber and stabilize

at room temperature for 24 ± 2 hours

before measuring.

Store in a test chamber set at 85ºC ± 2ºC/

85% ± 5% relative humidity for 1000 hours

(+48, -0) with rated voltage applied.

Remove from chamber and stabilize at

room temperature and humidity for

24 ± 2 hours before measuring.

1mm/sec

90 mm

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