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510BBA100M000AAG 数据手册 - Silicon Labs（芯科）
制造商:
Silicon Labs（芯科）
分类:
振荡器
封装:
SMD-6
描述:
SILICON LABS 510BBA100M000AAG 振荡器, 100MHZ, ±50PPM, 3.3V, SMD
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3D模型
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引脚图在P1P12Hot
典型应用电路图在P26
原理图在P1
封装尺寸在P10P16P18P20P22
型号编码规则在P1P14
封装信息在P14
技术参数、封装参数在P4P11P24
应用领域在P1
电气规格在P4
型号编号列表在P24
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510BBA100M000AAG数据手册
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Si510/511
10 Rev. 1.2
Table 7. Output Clock Jitter and Phase Noise (CMOS, Dual CMOS (Complementary))
V
DD
= 1.8 V ±5%, 2.5 or 3.3 V ±10%, T
A
= –40 to +85
o
C; Output Format = CMOS, Dual CMOS (Complementary)
Parameter
Symbol Test Condition Min Typ Max Unit
Phase Jitter
(RMS)
φJ 1.875 MHz to 20 MHz integration
bandwidth
2
(brickwall)
—0.250.35ps
12 kHz to 20 MHz integration band-
width
2
(brickwall)
—0.81.0ps
Phase Noise,
156.25 MHz
φN100Hz—–86—dBc/Hz
1 kHz — –108 — dBc/Hz
10 kHz — –115 — dBc/Hz
100 kHz — –123 — dBc/Hz
1 MHz — –136 — dBc/Hz
Spurious
SPR LVPECL output, 156.25 MHz,
offset>10 kHz
—–75—dBc
Notes:
1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,
212.5 MHz.
2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 MHz.
Table 8. Environmental Compliance and Package Information
Parameter Conditions/Test Method
Mechanical Shock
MIL-STD-883, Method 2002
Mechanical Vibration
MIL-STD-883, Method 2007
Solderability
MIL-STD-883, Method 2003
Gross and Fine Leak
MIL-STD-883, Method 1014
Resistance to Solder Heat
MIL-STD-883, Method 2036
Moisture Sensitivity Level
MSL 1
Contact Pads
Gold over Nickel
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