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A42MX16-3TQG176
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A42MX16-3TQG176数据手册
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40MX and 42MX FPGA Families
1-83 Revision 13
Pin Descriptions
CLK/A/B, I/O Global Clock
Clock inputs for clock distribution networks. CLK is for 40MX while CLKA and CLKB are for 42MX devices. The clock
input is buffered prior to clocking the logic modules. This pin can also be used as an I/O.
DCLK, I/O Diagnostic Clock
Clock input for diagnostic probe and device programming. DCLK is active when the MODE pin is HIGH. This pin
functions as an I/O when the MODE pin is LOW.
GND Ground
Input LOW supply voltage.
I/O Input/Output
Input, output, tristate or bidirectional buffer. Input and output levels are compatible with standard TTL and CMOS
specifications. Unused I/Os pins are configured by the Designer software as shown in Table 1-40.
In all cases, it is recommended to tie all unused MX I/O pins to LOW on the board. This applies to all dual-purpose pins
when configured as I/Os as well.
LP Low Power Mode
Controls the low power mode of all 42MX devices. The device is placed in the low power mode by connecting the LP
pin to logic HIGH. In low power mode, all I/Os are tristated, all input buffers are turned OFF, and the core of the device
is turned OFF. To exit the low power mode, the LP pin must be set LOW. The device enters the low power mode 800 ns
after the LP pin is driven to a logic HIGH. It will resume normal operation in 200 µs after the LP pin is driven to a logic
LOW.
MODE Mode
Controls the use of multifunction pins (DCLK, PRA, PRB, SDI, TDO). The MODE pin is held HIGH to provide
verification capability. The MODE pin should be terminated to GND through a 10k resistor so that the MODE pin can
be pulled HIGH when required.
NC No Connection
This pin is not connected to circuitry within the device. These pins can be driven to any voltage or can be left floating
with no effect on the operation of the device.
PRA, I/O
PRB, I/O Probe A/B
The Probe pin is used to output data from any user-defined design node within the device. Each diagnostic pin can be
used in conjunction with the other probe pin to allow real-time diagnostic output of any signal path within the device.
The Probe pin can be used as a user-defined I/O when verification has been completed. The pin's probe capabilities
can be permanently disabled to protect programmed design confidentiality. The Probe pin is accessible when the
MODE pin is HIGH. This pin functions as an I/O when the MODE pin is LOW.
QCLKA/B/C/D, I/O Quadrant Clock
Quadrant clock inputs for A42MX36 devices. When not used as a register control signal, these pins can function as
user I/Os.
Table 1-40 • Configuration of Unused I/Os
Device Configuration
A40MX02, A40MX04 Pulled LOW
A42MX09, A42MX16 Pulled LOW
A42MX24, A42MX36 Tristated

A42MX16-3TQG176 数据手册

Microsemi(美高森美)
150 页 / 9.59 MByte
Microsemi(美高森美)
124 页 / 3.06 MByte
Microsemi(美高森美)
5 页 / 0.06 MByte

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Microsemi(美高森美)
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Microsemi(美高森美)
Microsemi(美高森美)
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