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DAC084S085CIMM
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DAC084S085CIMM数据手册
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DAC084S085
SNAS363E MAY 2006REVISED MARCH 2013
www.ti.com
Package Thermal Resistances
Package θ
JA
10-Lead VSSOP 240°C/W
10-Lead SON 250°C/W
Electrical Characteristics
The following specifications apply for V
A
= +2.7V to +5.5V, V
REFIN
= V
A
, C
L
= 200 pF to GND, f
SCLK
= 30 MHz, input code
range 3 to 252. Boldface limits apply for T
MIN
T
A
T
MAX
and all other limits are at T
A
= 25°C, unless otherwise specified.
Units
Symbol Parameter Conditions Typical
(1)
Limits
(1)
(Limits)
STATIC PERFORMANCE
Resolution 8 Bits (min)
Monotonicity 8 Bits (min)
INL Integral Non-Linearity ±0.14 ±0.5 LSB (max)
+0.04 +0.18 LSB (max)
DNL Differential Non-Linearity V
A
= 2.7V to 5.5V
0.02 0.13 LSB (min)
ZE Zero Code Error I
OUT
= 0 +4 +15 mV (max)
FSE Full-Scale Error I
OUT
= 0 0.1 0.75 %FSR (max)
GE Gain Error All ones Loaded to DAC register 0.2 1.0 %FSR
ZCED Zero Code Error Drift 20 µV/°C
V
A
= 3V 0.7 ppm/°C
TC GE Gain Error Tempco
V
A
= 5V 1.0 ppm/°C
OUTPUT CHARACTERISTICS
(2)
0 V (min)
Output Voltage Range
V
REFIN
V (max)
High-Impedance Output Leakage
I
OZ
±1 µA (max)
Current
(2)
V
A
= 3V, I
OUT
= 200 µA 1.3 mV
V
A
= 3V, I
OUT
= 1 mA 6.0 mV
ZCO Zero Code Output
V
A
= 5V, I
OUT
= 200 µA 7.0 mV
V
A
= 5V, I
OUT
= 1 mA 10.0 mV
V
A
= 3V, I
OUT
= 200 µA 2.984 V
V
A
= 3V, I
OUT
= 1 mA 2.934 V
FSO Full Scale Output
V
A
= 5V, I
OUT
= 200 µA 4.989 V
V
A
= 5V, I
OUT
= 1 mA 4.958 V
V
A
= 3V, V
OUT
= 0V,
-56 mA
Input Code = FFh
Output Short Circuit Current
I
OS
(source)
V
A
= 5V, V
OUT
= 0V,
-69 mA
Input Code = FFh
V
A
= 3V, V
OUT
= 3V,
52 mA
Input Code = 00h
I
OS
Output Short Circuit Current (sink)
V
A
= 5V, V
OUT
= 5V,
75 mA
Input Code = 00h
Continuous Output
I
O
Avaliable on each DAC output 11 mA (max)
Current
(2)
R
L
= 1500 pF
C
L
Maximum Load Capacitance
R
L
= 2k 1500 pF
Z
OUT
DC Output Impedance 7.5
(1) Typical figures are at T
J
= 25°C, and represent most likely parametric norms. Test limits are specified to AOQL (Average Outgoing
Quality Level).
(2) This parameter is specified by design and/or characterization and is not tested in production.
4 Submit Documentation Feedback Copyright © 2006–2013, Texas Instruments Incorporated
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