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GRM21BR61E106KA73L 数据手册 - muRata（村田）
制造商:
muRata（村田）
分类:
陶瓷电容
封装:
0805
描述:
MURATA GRM21BR61E106KA73L 多层陶瓷电容器, 表面贴装, GRM系列, 10 µF, ± 10%, X5R, 25 V, 0805 [2012 公制]
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GRM21BR61E106KA73L数据手册
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25
X5R Dielectric
Specifications and Test Methods
Parameter/Test X5R Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber
Capacitance Within specified tolerance
≤ 2.5% for ≥ 50V DC rating Freq.: 1.0 kHz ± 10%
Dissipation Factor
≤ 3.0% for 25V DC rating Voltage: 1.0Vrms ± .2V
≤ 12.5% Max. for 16V DC rating and lower For Cap > 10 μF, 0.5Vrms @ 120Hz
Contact Factory for DF by PN
Insulation Resistance
10,000MΩ or 500MΩ - μF, Charge device with rated voltage for
whichever is less 120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation
≤ ±12%
Flexure Dissipation
Meets Initial Values (As Above)
Stresses Factor
Insulation
≥ Initial Value x 0.3
Resistance
Solderability
≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±7.5%
Dip device in eutectic solder at 260ºC for 60
Dissipation
Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
Factor
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes
Thermal
Factor
Shock
Insulation
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength 24 ± 2 hours at room temperature
Appearance No visual defects
Capacitance
Variation
≤ ±12.5%
Dissipation
≤ Initial Value x 2.0 (See Above)
Load Life Factor
Insulation
≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects
Capacitance
Variation
≤ ±12.5%
Load Dissipation
≤ Initial Value x 2.0 (See Above)
Humidity Factor
Insulation
≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Charge device with 1.5X rated voltage in
test chamber set at 85ºC ± 2ºC for 1000 hours
(+48, -0). Note: Contact factory for *optional
specification part numbers that are tested at
< 1.5X rated voltage.
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
1mm/sec
90 mm
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