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GRT31CR61H106KE01L 数据手册 - muRata（村田）
制造商:
muRata（村田）
分类:
陶瓷电容
封装:
1206
描述:
MURATA GRT31CR61H106KE01L 多层陶瓷电容器, 表面贴装, 1206 [3216 公制], 10 µF, 50 V, ± 10%, X5R, GRT Series 新
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GRT31CR61H106KE01L数据手册
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Pre-and Post-Stress
Electrical Test
2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 1000±12 hours at maximum operating
Exposure (Storage) specifications in the following table.
temperature ±3℃.
Appearance No marking defects Set for 24±2 hours at room temperature, then measure.
Capacitance R6, C8: Within ±12.5%
Change
Dissipation R6, C8: 0.2 max.
Factor
Insulation
25Ω・F min.
Resistance
3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table. the same conditions as (18). Perform the 1000 cycles test according
Appearance No marking defects to the four heat treatments in the following table.
Capacitance R6, C8: Within ±7.5% Set for 24±2 hours at room temperature, then measure.
Change
Dissipation R6, C8: 0.2 max.
Factor
Insulation
50Ω・F min.
Resistance
・Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive No defects or abnormalities Per EIA-469
Physical Analysis
5 Biased Humidity The measured and observed characteristics should satisfy the
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
specifications in the following table.
at 85±3℃ and 80 to 85% humidity for 1000±12 hours.
Appearance No marking defects
Remove and set for 24±2 hours at room temperature, then measure.
Capacitance R6,C8: Within ±12.5%
The charge/discharge current is less than 50mA.
Change
Dissipation R6,C8: 0.2 max
・Measurement after test for high dielectric constant type
Factor
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
Insulation
5Ω ・F min.
Resistance
-
1
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specifications.
Step
1
2
3
4
Temp.
(C)
-55+0/-3
Room
Temp.
85 +3/-0 (For R6)
105+3/-0 (For C8)
Room
Temp.
Time
(min.)
153
1
153
1
JEMCGS-01744J 2
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