Web Analytics
Datasheet 搜索 > ON Semiconductor(安森美) > NCP1034 数据手册 > NCP1034 数据手册 6/24 页
NCP1034
0
导航目录
  • 引脚图在P1
  • 典型应用电路图在P1P19P23
  • 原理图在P2
  • 封装尺寸在P24
  • 焊盘布局在P24
  • 型号编码规则在P1P23P24
  • 标记信息在P1P24
  • 封装信息在P23
  • 功能描述在P3
  • 技术参数、封装参数在P4P23
  • 应用领域在P1
  • 电气规格在P5P6
  • 型号编号列表在P4
NCP1034数据手册
Page:
of 24 Go
若手册格式错乱,请下载阅览PDF原文件
NCP1034
www.onsemi.com
6
ELECTRICAL CHARACTERISTICS (Unless otherwise specified, these specifications apply over V
CC
= 12 V,
DRVV
CC
= V
B
= 12 V, −40°C < TJ < 125°C)
Parameter UnitMaxTypMinTest ConditionSymbol
ERROR AMPLIFIER
Input Bias Current
I
FB
S
S
= 3 V, FB = 1 V −0.1 −0.4
A
Source/Sink Current I
(Source/Sink)
50 100 120
A
Bandwidth (Note 3) 4.0 10 MHz
DC gain (Note 3) 55 dB
Transconductance g
m
(Note 3) 1500 3150 4000
mho
SOFT−START/SD
Soft−Start Current
I
SS
S
S
= 0 V 15 20 25
A
Shutdown Output Threshold S
D
0.3 0.4 V
OVERCURRENT PROTECTION
OCSET Voltage V
OCSET
1.25 V
Hiccup Current I
Hiccup
(Note 3) 1.0
A
Hiccup Duty Cycle Hiccup
(duty)
I
Hiccup
/I
SS
, (Note 3)
5.0 %
OUTPUT DRIVERS
LO, Drive Rise Time
t
r
(Lo) C
L
= 1.5 nF (See Figure 3) 17 ns
HI Drive Rise Time t
r
(Hi) C
L
= 1.5 nF (See Figure 3) 17 ns
LO Drive Fall Time t
f
(Lo) C
L
= 1.5 nF (See Figure 3) 10 ns
HI Drive Fall Time t
f
(Hi) C
L
= 1.5 nF (See Figure 3) 10 ns
Dead Band Time t
dead
(See Figure 3) 30 60 120 ns
LO Output High Short Circuit
Pulsed Current
t
LDRVhigh
V
LDRV
= 0 V, P
W
v 10 s,
T
J
= 25°C (Note 3)
1.4 A
HI Output High Short Circuit
Pulsed Current
t
HDRVhigh
V
HDRV
= 0 V, P
W
v 10 s,
T
J
= 25°C (Note 3)
2.2 A
LO Output Low Short Circuit
Pulsed Current
t
LDRVhigh
V
LDRV
= DRVV
CC
, P
W
v 10 s,
T
J
= 25°C (Note 3)
1.4 A
HI Output Low Short Circuit
Pulsed Current
t
HDRVhigh
V
HDRV
= V
B
, P
W
v 10 s,
T
J
= 25°C (Note 3)
2.2 A
LO Output Resistor, Source R
LOH
Typical Value @ 25°C, (Note 3) 7 12
LO Output Resistor, Sink R
LOL
Typical Value @ 25°C, (Note 3) 2 8
HI Output Resistor, Source R
HIH
Typical Value @ 25°C, (Note 3) 7 12
HI Output Resistor, Sink R
HIL
Typical Value @ 25°C, (Note 3) 2 8
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Cold temperature performance is guaranteed via correlation using statistical quality control. Not tested in production.
3. Guaranteed by design but not tested in production.

NCP1034 数据手册

ON Semiconductor(安森美)
24 页 / 0.24 MByte
ON Semiconductor(安森美)
16 页 / 1.4 MByte
ON Semiconductor(安森美)
10 页 / 1.48 MByte
ON Semiconductor(安森美)
2 页 / 0.03 MByte
器件 Datasheet 文档搜索
器件加载中...
AiEMA 数据库涵盖高达 72,405,303 个元件的数据手册,每天更新 5,000 多个 PDF 文件