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SN65HVD3082ED 数据手册 - TI（德州仪器）
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TI（德州仪器）
分类:
接口芯片
封装:
SOIC-8
描述:
TEXAS INSTRUMENTS SN65HVD3082ED 收发器, RS485, 4.5V-5.5电源, SOIC-8
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SN65HVD3082ED数据手册
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SN65HVD3082E, SN75HVD3082E
SN65HVD3085E, SH65HVD3088E
www.ti.com
SLLS562G –AUGUST 2009–REVISED MAY 2009
RECOMMENDED OPERATING CONDITIONS
(1)
over operating free-air temperature range unless otherwise noted
MIN NOM MAX UNIT
Supply voltage, V
CC
4.5 5.5
V
Voltage at any bus terminal (separately or common mode) , V
I
–7 12
High-level input voltage (D, DE, or RE inputs), V
IH
2 V
CC
V
Low-level input voltage (D, DE, or RE inputs), V
IL
0 0.8 V
Differential input voltage, V
ID
–12 12 V
Driver –60 60
Output current, I
O
mA
Receiver –8 8
Differential load resistance, R
L
54 60 Ω
SN65HVD3082E, SN75HVD3082E 0.2
Signaling rate, 1/t
UI
SN65HVD3085E 1 Mbps
SN65HVD3088E 20
SN65HVD3082E, SN65HVD3085E, SN65HVD3088E –40 85
Operating free–air temperature, T
A
°C
SN75HVD3082E 0 70
Junction temperature, T
J
(2)
–40 130 °C
(1) The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
(2) See thermal characteristics table for information on maintenance of this specification for the DGK package.
SUPPLY CURRENT
over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP
(1)
MAX UNIT
D at V
CC
or open, DE at V
CC
,
Driver and receiver enabled 425 900 µA
RE at 0 V, No load
D at V
CC
or open, DE at V
CC
,
Driver enabled, receiver disabled 330 600 µA
RE at V
CC
, No load
I
CC
D at V
CC
or open, DE at 0 V,
Receiver enabled, driver disabled 300 600 µA
RE at 0 V, No load
D at V
CC
or open, DE at 0 V,
Driver and receiver disabled 0.001 2 µA
RE at V
CC
(1) All typical values are at 25°C and with a 5–V supply.
ELECTROSTATIC DISCHARGE PROTECTION
PARAMETER TEST CONDITIONS MIN TYP
(1)
MAX UNIT
Human body model Bus terminals and GND ±15 kV
Human body model
(2)
All pins ±4 kV
Charged-device-model
(3)
All pins ±1 kV
Electrical Fast Transient/Burst
(4)
A, B, and GND ±4 kV
(1) All typical values at 25°C.
(2) Tested in accordance with JEDEC Standard 22, Test Method A114–A and IEC 60749–26.
(3) Tested in accordance with JEDEC Standard 22, Test Method C101.
(4) Tested in accordance with IEC 61000–4–4.
Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Link(s): SN65HVD3082E SN75HVD3082E SN65HVD3085E SH65HVD3088E
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