Datasheet 搜索 > 运算放大器 > TI（德州仪器） > LM2902KVQPWRQ1 数据手册 > LM2902KVQPWRQ1 其他数据使用手册 4/14 页
器件3D模型￥ 2.657
LM2902KVQPWRQ1 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
运算放大器
封装:
TSSOP-14
描述:
翻两番运算放大器 QUADRUPLE OPERATIONAL AMPLIFIER
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
功能描述在P1
导航目录
LM2902KVQPWRQ1数据手册
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Texas Instruments Incorporated PCN 20161017001
SAM
HAST
A2
JEDEC JESD22-
A110
3
77
Biased HAST,
130C/85%RH
96 Hours
3/231/0
AEC-Q006
3
22
HAST SAM
Post 96 Hours
3/66/0
AEC-Q006
3
3
HAST Bond Pull (Ball
Bond)
Post 96 Hours
3/9/0
AEC-Q006
3
3
HAST Bond Pull (Stitch
Bond)
Post 96 Hours
3/9/0
AEC-Q006
3
3
HAST Bond Shear
Post 96 Hours
3/9/0
AEC-Q006
3
1
HAST Cross-Section
Post 96 Hours
3/3/0
HAST
A2
JEDEC JESD22-
A110
3
70
Biased HAST,
130C/85%RH
192 Hours
3/210/0
AEC-Q006
3
22
HAST SAM
Post 192 Hours
3/66/0
AEC-Q006
3
2
HAST Bond Pull (Ball
Bond)
Post 192 Hours
3/6/0
AEC-Q006
3
2
HAST Bond Pull (Stitch
Bond)
Post 192 Hours
3/6/0
AEC-Q006
3
2
HAST Bond Shear
Post 192 Hours
3/6/0
AEC-Q006
3
1
HAST Cross-Section
Post 192 Hours
3/3/0
AC
A3
JEDEC JESD22-
A102
3
77
Autoclave 121C
96 Hours
3/231/0
AC
A3
JEDEC JESD22-
A102
3
77
Autoclave 121C
192 Hours
3/231/0
TC
A4
JEDEC JESD22-
A104 and
Appendix 3
3
77
Temperature Cycle, -
65/150C
500 Cycles
3/231/0
AEC-Q006
3
22
Temp Cycle SAM
Post 500 Cycles
3/66/0
AEC-Q006
3
3
Temp Cycle Bond Pull
(Ball Bond)
Post 500 Cycles
3/9/0
AEC-Q006
3
3
Temp Cycle Bond Pull
(Stitch Bond)
Post 500 Cycles
3/9/0
AEC-Q006
3
3
Temp Cycle Bond Shear
Post 500 Cycles
3/9/0
AEC-Q006
3
1
Temp Cycle Cross-
Section
Post 500 Cycles
3/3/0
TC
A4
JEDEC JESD22-
A104 and
Appendix 3
3
70
Temperature Cycle, -
65/150C
1000 Cycles
3/210/0
AEC-Q006
3
22
Temp Cycle SAM
Post 1000 Cycles
3/66/0
AEC-Q006
3
2
Temp Cycle Bond Pull
(Ball Bond)
Post 1000 Cycles
3/6/0
AEC-Q006
3
2
Temp Cycle Bond Pull
(Stitch Bond)
Post 1000 Cycles
3/6/0
AEC-Q006
3
2
Temp Cycle Bond Shear
Post 1000 Cycles
3/6/0
AEC-Q006
3
1
Temp Cycle Cross-
Section
Post 1000 Cycles
3/3/0
PTC
A5
JEDEC JESD22-
A105
1
45
Power Temperature Cycle,
-40/125C
1000 Cycles
1/45/0
PTC
A5
JEDEC JESD22-
A105
1
45
Power Temperature Cycle,
-40/125C
2000 Cycles
1/45/0
HTSL
A6
JEDEC JESD22-
A103
3
45
High Temp. Storage
Bake, 150C
1000 Hours
3/135/0
AEC-Q006
3
1
HTSL Cross-Section
Post 1000 Hours
3/3/0
HTSL
A6
JEDEC JESD22-
A103
3
44
High Temp. Storage
Bake, 150C
2000 Hours
3/132/0
AEC-Q006
3
1
HTSL Cross-Section
Post 2000 Hours
3/3/0
Test Group B – Accelerated Lifetime Simulation Tests
HTOL
B1
JEDEC JESD22-
A108
3
77
Life Test, 125C
1000 Hours
3/231/0
EDR
B3
AEC Q100-005
3
77
NVM Endurance, Data
Retention, and
Operational Life
-
N/A
Test Group C – Package Assembly Integrity Tests
WBS
C1
AEC Q100-001
1
30
Bond Shear (Cpk>1.67)
Wires
3/90/0
WBP
C2
MIL-STD883
1
30
Bond Pull Cpk>1.67
Wires
3/90/0
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