Datasheet 搜索 > 逻辑芯片 > TI（德州仪器） > SN74LVC1G11DBVR 数据手册 > SN74LVC1G11DBVR 其他数据使用手册 1/22 页
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SN74LVC1G11DBVR 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
逻辑芯片
封装:
SOT-23-6
描述:
TEXAS INSTRUMENTS SN74LVC1G11DBVR. 芯片, 单路与门, 3输入, SOT-23-6, 整卷
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SN74LVC1G11DBVR数据手册
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of 22 Go
若手册格式错乱，请下载阅览PDF原文件
See mechanical drawings for dimensions.
DBV PACKAGE
(TOP VIEW)
2
GND
V
CC
5
3
4
B
Y
6
1
A
C
DCK PACKAGE
(TOP VIEW)
3
4
B
2
GND
Y
5
1
A
V
CC
6
C
DRY PACKAGE
(TOP VIEW)
GND
V
CC
A
6
5
4
2
3
B Y
C
1
YZP PACKAGE
(BOTTOM VIEW)
GND V
CC
A
B
2
1
3
Y
5
4
6
C
A
B
DSF PACKAGE
(TOP VIEW)
GND
C
Y
V
CC
6
5
4
2
3
1
Y + A • B • C or Y + A) B ) C
SN74LVC1G11
www.ti.com
SCES487F –SEPTEMBER 2003–REVISED DECEMBER 2013
Single 3-Input Positive-AND Gate
Check for Samples: SN74LVC1G11
1
FEATURES
DESCRIPTION
The SN74LVC1G11 performs the Boolean function
2
• Available in the Texas Instruments NanoFree™
in positive logic.
Package
• Supports 5-V V
CC
Operation
NanoFree™ package technology is a major
breakthrough in IC packaging concepts, using the die
• Inputs Accept Voltages to 5.5 V
as the package.
• Max t
pd
of 4.1 ns at 3.3 V
This device is fully specified for partial-power-down
• Low Power Consumption, 10-μA Max I
CC
applications using I
off
. The I
off
circuitry disables the
• ±24-mA Output Drive at 3.3 V
outputs, preventing damaging current backflow
• I
off
Supports Partial-Power-Down Mode
through the device when it is powered down.
Operation
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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