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Datasheet 搜索 > 接口芯片 > TI(德州仪器) > TS3USB221RSER 数据手册 > TS3USB221RSER 产品修订记录 5/7 页
TS3USB221RSER
器件3D模型
0.644
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  • 封装尺寸在P5P6P7
  • 型号编号列表在P2
TS3USB221RSER数据手册
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Texas Instruments, Inc. PCN# 20160202001
Qualification Report
ASEN RSE Package (Hong-how HP20Vl-RH screen print)
Qualification Approved on 1/21/2016
Product Attributes
Attributes
Qual Device:
TS3USB221ERSER
QBS Product
Reference:
TS3USB221ARSE
QBS Product
Reference:
TS3USB221EDRC
QBS Package
Reference:
SN74AVC4T245RSVR
Assembly Site
ASEN
NSE
TIM (MAL)
ASEN
Package Family
QFN
QFN
QFN
-
Flammability Rating
UL 94 V-0
UL 94 V-0
UL 94 V 0
UL 94 V-0
Wafer Fab Supplier
FFAB
FFAB
FFAB
FFAB
Wafer Process
50B10
50b10.13
50B10.13
ASLC10
- QBS: Qual By Similarity
- Qual Devices qualified at LEVEL1-260C: TS3USB221RSER, TS3USB221ERSER
- Qual Devices qualified at LEVEL1-260CG: TS3USB221ARSER, TS5A23159RSER
Qualification Results
Data Displayed as: Number of lots / Total sample size / Total failed
Type
Test Name / Condition
Duration
Qual Device:
TS3USB221ERSER
QBS Product
Reference:
TS3USB221ARSE
QBS Product
Reference:
TS3USB221EDRC
QBS Package
Reference:
SN74AVC4T245RSVR
AC
Autoclave 121C
96 Hours
-
3/231/0
-
3/231/0
ED
Electrical Characterization
Per Datasheet
Parameters
-
Pass
Pass
Pass
FLAM
Flammability (IEC 695-2-2)
--
-
-
-
3/15/0
FLAM
Flammability (UL 94V-0)
--
-
-
-
3/15/0
FLAM
Flammability (UL-1694)
--
-
-
-
3/15/0
HAST
Biased HAST, 130C/85%RH
96 Hours
-
3/231/0
-
3/231/0
HBM
ESD - HBM
7000 V
-
3/9/0
1/3/0
-
HBM
ESD - HBM -HIGH
12000 V
-
3/9/0
-
-
CDM
ESD - CDM
1500 V
-
3/9/0
1/3/0
-
HTOL
Life Test, 150C
300 Hours
-
3/348/0
-
3/231/0
HTSL
High Temp. Storage Bake,
170C
420 Hours
-
-
-
3/231/0
HTSL
High Temp. Storage Bake,
150C
1000 Hours
-
3/231/0
-
-
LU
Latch-up
(per JESD78)
-
3/9/0
1/6/0
-
PD
Physical Dimensions
--
3/15/0
-
-
3/15/0
SD
Solderability
Pb Free
-
-
-
3/66/0
TC
Temperature Cycle, -
65/150C
500 Cycles
-
3/231/0
-
3/231/0
WBP
Bond Strength
Wires
3/228/0
-
-
3/228/0
- Preconditioning was performed for Autoclave, Unbiased HAST, THB/Biased HAST, Temperature Cycle, Thermal Shock, and HTSL, as
applicable
- The following are equivalent HTOL options based on an activation energy of 0.7eV : 125C/1k Hours, 140C/480 Hours, 150C/300 Hours, and
155C/240 Hours
- The following are equivalent HTSL options based on an activation energy of 0.7eV : 150C/1k Hours, and 170C/420 Hours
- The following are equivalent Temp Cycle options per JESD47 : -55C/125C/700 Cycles and -65C/150C/500 Cycles
Quality and Environmental data is available at TI's external Web site: http://www.ti.com/
Green/Pb-free Status:
Qualified Pb-Free(SMT) and Green

TS3USB221RSER 数据手册

TI(德州仪器)
27 页 / 1.31 MByte
TI(德州仪器)
21 页 / 1.22 MByte
TI(德州仪器)
7 页 / 0.25 MByte
TI(德州仪器)
1 页 / 0.12 MByte

TS3USB221 数据手册

TI(德州仪器)
具有单使能端的高速 USB 2.0 (480Mbps) 1:2 多路复用器/多路解复用器开关
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221RSER.  芯片, 模拟开关, SPDT, USB2.0接口
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221ARSER  芯片, 总线开关, ESD, USB 2.0, 10QFN
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221DRCR  接口, USB, 多路复用器/信号分离器开关, USB 2.0, 2.3 V, 3.6 V, SON, 10 引脚
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221ERSER  接口, USB, 多路复用器/信号分离器开关, USB 2.0, 2.3 V, 3.6 V, UQFN, 10 引脚
TI(德州仪器)
ESD保护,高速USB 2.0 ( 480 Mbps)的1:单ENABLE 2复用器/解复用器开关 ESD PROTECTED, HIGH-SPEED USB 2.0 (480-Mbps) 1:2 MULTIPLEXER/DEMULTIPLEXER SWITCH WITH SINGLE ENABLE
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221EDRCR  芯片, 多路复用器/信号分离器开关, USB, 1:2, 480MBPS, SON-10, 整卷
TI(德州仪器)
高速USB 2.0 ( 480 Mbps)的1:单ENABLE 2复用器/解复用器开关 HIGH-SPEED USB 2.0 (480-Mbps) 1:2 MULTIPLEXER/DEMULTIPLEXER SWITCH WITH SINGLE ENABLE
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221EEVM  评估模块, TS3USB221EEVM, 低功率消耗, 静电防护性能输入/输出端口至GND
TI(德州仪器)
TEXAS INSTRUMENTS  TS3USB221EVM  评估板, TS3USB221 USB接口
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