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CAV24C02 数据手册 - ON Semiconductor（安森美）
制造商:
ON Semiconductor（安森美）
描述:
2 KB ， 4 KB ， 8 KB和16 KB的I2C CMOS串行EEPROM 2-Kb, 4-Kb, 8-Kb and 16-Kb I2C CMOS Serial EEPROM
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P1P5Hot
封装尺寸在P10P11P12P13
焊盘布局在P12P13
型号编码规则在P1P14P15
标记信息在P2P14P15
封装信息在P14
功能描述在P5
技术参数、封装参数在P2P14
应用领域在P1
电气规格在P3
型号编号列表在P2
导航目录
CAV24C02数据手册
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若手册格式错乱，请下载阅览PDF原文件
CAV24C02, CAV24C04, CAV24C08, CAV24C16
www.onsemi.com
2
DEVICE MARKINGS
(SOIC−8)(TSSOP−8)
CSSS
AYMXXX
24CSSS
AYMXXX
G
G
CSSS = Specific Device Code, where
SSS = 02H for CAV24C02
SSS = 04K for CAV24C04
SSS = 08K for CAV24C08
SSS = 16K for CAV24C16
A = Assembly Location
Y = Production Year (Last Digit)
M = Production Month (1−9, O, N, D)
XXX = Last Three Digits of Assembly Lot Number
G = Pb−Free Package
24CSSS= Specific Device Code, where
SSS = 02H for CAV24C02
SSS = 04K for CAV24C04
SSS = 08K for CAV24C08
SSS = 16K for CAV24C16
A = Assembly Location
Y = Production Year (Last Digit)
M = Production Month (1−9, O, N, D)
XXX = Last Three Digits of Assembly Lot Number
G = Pb−Free Package
TOP MARKING FOR WLCSP
X = Specific Device
X = Code
4 = 24C04
8 = 24C08
6 = 24C16
YW = Production Date Code
WLCSP−4 WLCSP−5
X X
Y W Y W
Pin 1
(Ball Down)
Pin 1
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters Ratings Units
Storage Temperature −65 to +150 °C
Voltage on any pin with respect to Ground (Note 1) −0.5 to +6.5 V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. During input transitions, voltage undershoot on any pin should not exceed −1 V for more than 20 ns. Voltage overshoot on pins A
0
, A
1
, A
2
and WP should not exceed V
CC
+ 1 V for more than 20 ns, while voltage on the I
2
C bus pins, SCL and SDA, should not exceed the absolute
maximum ratings, irrespective of V
CC
.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol Parameter Min Units
N
END
(Note 3) Endurance 1,000,000 Program / Erase Cycles
T
DR
Data Retention 100 Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, V
CC
= 5 V, 25°C.
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