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器件3D模型￥ 3.603
INA333AIDGKR 数据手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
仪表放大器
封装:
VSSOP-8
描述:
TEXAS INSTRUMENTS INA333AIDGKR 仪器放大器, 1个放大器, 10 µV, 0.16 V/µs, 150 kHz, 1.8V 至 5.5V, VSSOP
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INA333AIDGKR数据手册
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ELECTRICAL CHARACTERISTICS: V
S
= +1.8V to +5.5V
INA333
www.ti.com
..................................................................................................................................................... SBOS445B – JULY 2008 – REVISED OCTOBER 2008
Boldface limits apply over the specified temperature range, T
A
= – 40 ° C to +125 ° C.
At T
A
= +25 ° C, R
L
= 10k Ω , V
REF
= V
S
/2, and G = 1, unless otherwise noted.
INA333
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
INPUT
(1)
Offset voltage, RTI
(2)
V
OSI
± 10 ± 25/G ± 25 ± 75/G µ V
vs Temperature ± 0.1 ± 0.5/G µ V/ ° C
vs Power supply PSR 1.8V ≤ V
S
≤ 5.5V ± 1 ± 5/G ± 5 ± 15/G µ V/V
Long-term stability See note
(3)
Turn-on time to specified V
OSI
See Typical characteristics
Impedance
Differential Z
IN
100 || 3 G Ω || pF
Common-mode Z
IN
100 || 3 G Ω || pF
Common-mode voltage range V
CM
V
O
= 0V (V – ) + 0.1 (V+) – 0.1 V
Common-mode rejection CMR DC to 60Hz
G = 1 V
CM
= (V – ) + 0.1V to (V+) – 0.1V 80 90 dB
G = 10 V
CM
= (V – ) + 0.1V to (V+) – 0.1V 100 110 dB
G = 100 V
CM
= (V – ) + 0.1V to (V+) – 0.1V 100 115 dB
G = 1000 V
CM
= (V – ) + 0.1V to (V+) – 0.1V 100 115 dB
INPUT BIAS CURRENT
Input bias current I
B
± 70 ± 200 pA
vs Temperature See Typical Characteristic curve pA/ ° C
Input offset current I
OS
± 50 ± 200 pA
vs Temperature See Typical Characteristic curve pA/ ° C
INPUT VOLTAGE NOISE
Input voltage noise e
NI
G = 100, R
S
= 0 Ω
f = 10Hz 50 nV/ √ Hz
f = 100Hz 50 nV/ √ Hz
f = 1kHz 50 nV/ √ Hz
f = 0.1Hz to 10Hz 1 µ V
PP
Input current noise i
N
f = 10Hz 100 fA/ √ Hz
f = 0.1Hz to 10Hz 2 pA
PP
GAIN
Gain equation G 1 + (100k Ω /R
G
) V/V
Range of gain 1 1000 V/V
Gain error V
S
= 5.5V, (V – ) + 100mV ≤ V
O
≤ (V+) – 100mV
G = 1 ± 0.01 ± 0.1 %
G = 10 ± 0.05 ± 0.25 %
G = 100 ± 0.07 ± 0.25 %
G = 1000 ± 0.25 ± 0.5 %
(1) Total V
OS
, Referred-to-input = (V
OSI
) + (V
OSO
/G).
(2) RTI = Referred-to-input.
(3) 300-hour life test at +150 ° C demonstrated randomly distributed variation of approximately 1 µ V.
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Link(s): INA333
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