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INA333AIDGKR 产品修订记录 - TI(德州仪器)
制造商:
TI(德州仪器)
分类:
仪表放大器
封装:
VSSOP-8
描述:
TEXAS INSTRUMENTS INA333AIDGKR 仪器放大器, 1个放大器, 10 µV, 0.16 V/µs, 150 kHz, 1.8V 至 5.5V, VSSOP
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INA333AIDGKR数据手册
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Texas Instruments, Inc. PCN# 20141216000
PCN Number:
20141216000
PCN Date:
12/17/2014
Title:
INA333 / TAS5733 / F6779A Die Revision Change
Customer Contact:
PCN Manager
Phone:
+1(214)480-6037
Dept:
Quality Services
Proposed 1
st
Ship Date:
3/17/2015
Estimated Sample
Availability:
Date provided at
sample request.
Change Type:
Assembly Site
Assembly Process
Assembly Materials
Design
Electrical Specification
Mechanical Specification
Test Site
Packing/Shipping/Labeling
Test Process
Wafer Bump Site
Wafer Bump Material
Wafer Bump Process
Wafer Fab Site
Wafer Fab Materials
Wafer Fab Process
Part number change
PCN Details
Description of Change:
This notification is to inform of a design change to select devices. The design changes do not
affect the device’s guaranteed datasheet specifications or electrical performance. Affected devices
are listed in “Product Affected” section. Design changes as follows:
Group 1 Devices: INA333 Die Rev Change (Rev E to Rev F)
Description of Change Benefit of Change
Metal change on the existing design in order to correct noise
issues at different temperatures and supply voltages.
Continuous Improvement
Group 2 Devices: TAS5733 Die Rev Change (Rev B to Rev C)
Description of Change Benefit of Change
Power die conversion on the TAS5733PHP devices to improve
yield and product performance.
Continuous Improvement
Group 3 Devices: F6779A DMA9 Die Rev Change (Rev B to Rev C)
Description of Change Benefit of Change
Bug fix for DMA9.
Enabling customer business
Reason for Change:
Improved product performance
Anticipated impact on Form, Fit, Function, Quality or Reliability (positive / negative):
None
Changes to product identification resulting from this PCN:
Sample product shipping label (not actual product label)
Group 1 Devices – Die Rev Marking:
Current New
Die Rev [2P]
Die Rev [2P]
E
F
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